| MRC | Criteria | Characteristic |
|---|
| AAQL | BODY STYLE | CHIP TYPE" |
| AARG | RELIABILITY INDICATOR | ESTABLISHED" |
| AARH | RELIABILITY FAILURE RATE LEVEL IN PERCENT | 0.010" |
| ABJT | TERMINAL LENGTH | 0.5 MILLIMETERS NOMINAL" |
| ADAQ | BODY LENGTH | 3.2 MILLIMETERS NOMINAL" |
| ADAT | BODY WIDTH | 2.5 MILLIMETERS NOMINAL" |
| ADAU | BODY HEIGHT | 1.5 MILLIMETERS MAXIMUM" |
| AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S)" |
| AGAV | END ITEM IDENTIFICATION | VHF OMNIRANGE,DISTANCE MEASURING EQUIPMENT (VOR DME)" |
| CQBF | INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP | 1000.0 MEGOHMS" |
| CQBQ | CAPACITANCE VALUE PER SECTION | 1000.000 PICOFARADS SINGLE SECTION" |
| CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM" |
| CQLZ | TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS | 0.0 SINGLE SECTION" |
| CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 100.0 DC SINGLE SECTION" |
| CRHD | TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS | -30.0/+30.0 SINGLE SECTION" |
| CRTP | TOLERANCE RANGE PER SECTION | -5.00/+5.00 PERCENT SINGLE SECTION" |
| CWJK | CASE MATERIAL | CERAMIC" |
| CWPK | INSULATION RESISTANCE AT REFERENCE TEMP | 100000.0 MEGOHMS" |
| CWPM | DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 0.150" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| TEST | TEST DATA DOCUMENT | 81349-MIL-C-55681 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI" |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 BONDING PAD" |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-C-55681/8 GOVERNMENT SPECIFICATION" |
| AAQL | BODY STYLE | CHIP TYPE" |
| AARG | RELIABILITY INDICATOR | ESTABLISHED" |
| AARH | RELIABILITY FAILURE RATE LEVEL IN PERCENT | 0.010" |
| ABJT | TERMINAL LENGTH | 0.5 MILLIMETERS NOMINAL" |
| ADAQ | BODY LENGTH | 3.2 MILLIMETERS NOMINAL" |
| ADAT | BODY WIDTH | 2.5 MILLIMETERS NOMINAL" |
| ADAU | BODY HEIGHT | 1.5 MILLIMETERS MAXIMUM" |
| AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S)" |
| AGAV | END ITEM IDENTIFICATION | VHF OMNIRANGE,DISTANCE MEASURING EQUIPMENT (VOR DME)" |
| CQBF | INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP | 1000.0 MEGOHMS" |
| CQBQ | CAPACITANCE VALUE PER SECTION | 1000.000 PICOFARADS SINGLE SECTION" |
| CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM" |
| CQLZ | TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS | 0.0 SINGLE SECTION" |
| CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 100.0 DC SINGLE SECTION" |
| CRHD | TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS | -30.0/+30.0 SINGLE SECTION" |
| CRTP | TOLERANCE RANGE PER SECTION | -5.00/+5.00 PERCENT SINGLE SECTION" |
| CWJK | CASE MATERIAL | CERAMIC" |
| CWPK | INSULATION RESISTANCE AT REFERENCE TEMP | 100000.0 MEGOHMS" |
| CWPM | DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 0.150" |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
| TEST | TEST DATA DOCUMENT | 81349-MIL-C-55681 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI" |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 BONDING PAD" |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-C-55681/8 GOVERNMENT SPECIFICATION" |